Electro-optical measurement of hysteresis in interferometric...

Details Electro-optical measurement of hysteresis in interferometric... Electro-optical measurement of hysteresis in interferometric...

G - Physics

01

M

G01M 11/02 (2006.01) B81B 7/02 (2006.01) G02F 1/01 (2006.01) G02F 1/13 (2006.01) G02F 1/21 (2006.01) G09F 9/00 (2006.01)

Patent

CA 2514344

Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

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