G - Physics – 01 – V
Patent
G - Physics
01
V
324/12
G01V 3/08 (2006.01) G01V 3/38 (2006.01) G01V 3/40 (2006.01)
Patent
CA 1246673
ELECTROMAGNETIC ARRAY PROFILING SURVEY METHOD ABSTRACT An electromagnetic survey method for geophysical exploration, in which the variations in the earth's magnetic field are measured in two, non-parallel directions at one point in the survey area. Simultaneously, the variations in the earth's electrical field parallel to the survey line are measured at a number of points along the survey line. These measured variations are transformed to the frequency domain, and then the horizontal component of the magnetic field orthogonal to the direction of the measured electrical field is calculated. The impedance at each measurement point on the survey line is calculated as a function of frequency, and weighted averages of the impedances for predetermined frequencies using a zero phase length weight function corresponding to a low pass filter applied to the electric field are used to calculate the subsurface conductivity distribution.
508778
Ridout & Maybee Llp
The Board Of Regents The University Of Texas System
LandOfFree
Electromagnetic array profiling survey method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electromagnetic array profiling survey method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electromagnetic array profiling survey method will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1310683