Electromagnetic profile scanner

Details Electromagnetic profile scanner Electromagnetic profile scanner

G - Physics

01

B

G01B 11/24 (2006.01) G01B 11/245 (2006.01) G01B 11/25 (2006.01)

Patent

CA 2163934

A system for determining the shape and dimensions of a surface of an object includes a projector for projecting onto the object a spatially coded pattern of radiation, e.g., light. The system also includes a receiving device capable of imaging the reflected pattern, and a discriminator for determining which portion of the reflected pattern corresponds to which portion of the projected pattern. By this means, a received signal representing less than the complete reflection from the projected pattern can be correlated with a discrete portion of the scanned object. The procedure is repeated to obtain enough reliable data to generate a reasonably reliable surface profile. The resulting set of received signals and correlations are used to calculate the shape and dimensions of the object.

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