Electromagnetic wave source probing device and probing...

Details Electromagnetic wave source probing device and probing... Electromagnetic wave source probing device and probing...

G - Physics

01

S

G01S 3/04 (2006.01) G01R 29/08 (2006.01)

Patent

CA 2269170

A quite novel electromagnetic wave source probing device and a method with such a device in which the probing time can be shortened. Magnetic field to time characteristics generated from a subject to be measured are measured in a plurality of positions. Electric field to frequency characteristics generated from the subject to be measured are calculated by use of the plurality of measured magnetic field to time characteristics. Frequency components exceeding a predetermined electric field value are extracted in the calculated electric field to frequency characteristics. Positions where currents having the extracted frequency components exist in the subject to be measured are outputted.

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