Electron beam testing of electronic components

Details Electron beam testing of electronic components Electron beam testing of electronic components

G - Physics

01

R

358/10

G01R 31/28 (2006.01) G01R 31/305 (2006.01)

Patent

CA 1307057

ELECTRON BEAM TESTING OF ELECTRONIC COMPONENTS Abstract of the Disclosure An electron beam testing apparatus for applying an electron beam to parts of an electronic component and measuring the secondary electrons released from the part including a secondary electron collector having a plurality of vertically extending screens with a detector positioned adjacent one of the screens. A different voltage is applied to each of the screens of the collector for collecting the secondary electrons over a large area. The apparatus may include a combination blanking and Faraday cup for metering the electron beam current when it is blanked. The apparatus may also be used to measure net work capacitance by measuring the time required to charge a network to a predetermined voltage.

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