Electron microscope comprising an x-ray detector

Details Electron microscope comprising an x-ray detector Electron microscope comprising an x-ray detector

H - Electricity

01

J

358/10

H01J 37/26 (2006.01) H01J 37/244 (2006.01)

Patent

CA 1190329

ABSTRACT "Electron microscope comprising an X-ray detector." A detector for measuring X-rays in an electron microscope comprises a shield which shields a detector entrance window against the incidence of electrons or not in accordance with the various measuring settings. The shield may be arranged to be movable under the influence of the magnetic field strength variation which occurs during the switching over between the various measuring settings.

395054

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