Electronic comparator for process control

Details Electronic comparator for process control Electronic comparator for process control

G - Physics

01

B

354/25, 340/123.

G01B 11/04 (2006.01) G01B 11/00 (2006.01) G01B 11/06 (2006.01) G05B 1/01 (2006.01) G05B 1/03 (2006.01)

Patent

CA 1083244

Abstract of the Disclosure An optical micrometer scans an article passing through its zone of measurement to provide a series of pulses representing the dimension of an article. Each new measurement is compared against a previous measure- ment, or an average of a predetermined number of previous measurements, and the difference is then compared to a previously established deviation limit. If this dif- ference does not exceed the deviation limit, then the new measurement is transferred to the output of the circuit for utilization by the system, but if this dif- ference exceeds the deviation limit, then the previous measurement signal will be transferred to the output. An alarm is provided whenever a predetermined number of new measurement signals outside the deviation limit occur within a certain number of measurement intervals.

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