Electrooptic apparatus for the measurement of ultrashort...

Details Electrooptic apparatus for the measurement of ultrashort... Electrooptic apparatus for the measurement of ultrashort...

G - Physics

01

R

324/65

G01R 31/308 (2006.01) G01R 1/07 (2006.01) G01R 15/24 (2006.01) G01R 29/02 (2006.01)

Patent

CA 2014681

An electrooptic measuring apparatus having both high voltage sensitivity and femtosecond time resolution comprises coplanar transmission linefabricated on a semi-insulating multiple quantum well structure. An electrical signal, such as from a high speed electrooptic device, injected onto the transmission lines creates an electrical field parallel to the layer planes of the multiple quantum well structure. Excitonic electroabsorption by the multiple quantum well structure, in response to the parallel field, changes the transmissivity of the multiple quantum well structure. An external light beam directed through the multiple quantum well structure is modulated by the changes in transmissivity. By detecting this modulation, a sampling of the electrical signal is achieved.

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