Electrooptic probe for vector measurement of an...

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01R 29/08 (2006.01) G01R 29/14 (2006.01)

Patent

CA 2655034

The invention relates to a device for measuring two components of an electromagnetic field in an analysis zone, said device comprising: a light source (7) sending a polarized light beam into a polarization-maintaining optical fibre (5), said beam being directed along one axis of the fibre; an isotropic electrooptic material (21) placed in said zone, receiving the beam from the optical fibre via a quarter-wave plate (22) having its axes oriented at an angle of 45° to the axes of the optical fibre and sending a beam into this fibre, this plate being slightly detuned as regards is characteristic or its orientation; means (13-14) for phase-shifting the beam sent into the fibre, which means are set so as to impose a phase shift (g) equal and opposite to that (q) imposed by the fibre; and means for analyzing the orientation and the ellipticity of the wave exiting the phase-shifting means.

L'invention concerne un dispositif de mesure de deux composantes d'un champ électromagnétique dans une zone d'analyse, comprenant une source lumineuse (7) envoyant dans une fibre optique à maintien de polarisation (5) un faisceau lumineux polarisé selon un axe de la fibre; un matériau électro-optique isotrope (21) disposé dans ladite zone, recevant le faisceau de la fibre optique par l'intermédiaire d'une lame quart d'onde (22) ayant ses axes orientés à un angle de 45° des axes de la fibre optique et renvoyant un faisceau dans cette fibre, cette lame étant légèrement déréglée quant à sa caractéristique ou à son orientation; des moyens (13-14) de déphasage du faisceau renvoyé dans la fibre réglés pour imposer un déphasage (.gamma.) égal et opposé à celui (.theta.) imposé par la fibre; des moyens d'analyse de l'orientation et de l'ellipticité de l'onde sortant des moyens de déphasage.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Electrooptic probe for vector measurement of an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrooptic probe for vector measurement of an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrooptic probe for vector measurement of an... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-2038745

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.