G - Physics – 01 – R
Patent
G - Physics
01
R
356/2, 324/58.1
G01R 31/28 (2006.01) H05K 1/02 (2006.01) H05K 3/00 (2006.01)
Patent
CA 2025952
EMBEDDED TESTING CIRCUIT AND METHOD FOR FABRICATING SAME ABSTRACT An improved structure for testing the operability of a completed circuit board having components thereon and improved method of fabricating same are disclosed. The structure and process include the use of an insulator portion with a printed circuit board adhered thereto which includes a testing pattern to evaluate the operability of a completed printed circuit board. The insulator portion which provides support for the test pattern extends past the edge of the printed circuit board thereby providing a remote means] to test the operability of the printed circuit board without having to utilize valuable space and contact points on the printed board itself to test the operability of the completed printed circuit board once components have been installed.
Compaq Computer Corporation
Finlayson & Singlehurst
LandOfFree
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