Enhanced imaging method and apparatus

Details Enhanced imaging method and apparatus Enhanced imaging method and apparatus

G - Physics

01

B

G01B 11/245 (2006.01) G01N 21/55 (2006.01) H04N 5/243 (2006.01) G01N 21/896 (2006.01)

Patent

CA 2683206

This invention provides accurate, high quality images for the identification of the surface characteristics of an object, that may be used as an input to suitable industrial process. It involves acquiring a first raw scan of a portion of a target object across a scan line in a scan zone with a first camera and simultaneously acquiring a second raw scan of the same portion of the target object across the scan line in the scan zone with a second camera. The raw scans are converted to digital and then processed with flattening coefficients derived from measurements of variations in illumination. The first and second cameras sets of flattened image data are then gridized to compensate for parallax, make them orthographic sets of image data that can be compared on a pixel-by-pixel basis with a known or measured geometric profile of the target. A selection of enhanced pixel value for a surface coordinate can then be made, based on both sets of data. The obscuring of surface features by specular reflection can thus be effectively eliminated.

Affiliated with

Also associated with

Rating

Enhanced imaging method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Enhanced imaging method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Enhanced imaging method and apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1749421