Epitaxial silicon layer and method to deposit such

H - Electricity – 01 – L

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356/148, 356/182

H01L 21/20 (2006.01) H01L 21/205 (2006.01) H01L 21/22 (2006.01) H01L 21/223 (2006.01)

Patent

CA 2040660

An in-situ doped n-type silicon layer is provided by a low temperature, low pressure chemical vapor deposition process employing a germanium-containing gas in combination with the n-type dopant containing gas to thereby enhance the in-situ incorporation of the n-type dopant into the silicon layer as an electronically active dopant. Also provided are a silicon layer including a P-N junction wherein the layer contains an n-type dopant and germanium, and devices such as transistors incorporating an in-situ n-doped silicon layer.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Epitaxial silicon layer and method to deposit such does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Epitaxial silicon layer and method to deposit such, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Epitaxial silicon layer and method to deposit such will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1418818

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.