Examining a gemstone

Details Examining a gemstone Examining a gemstone

H - Electricity

04

N

350/32, 354/55

H04N 7/18 (2006.01) B24B 9/16 (2006.01) G01B 11/02 (2006.01) G01N 21/87 (2006.01)

Patent

CA 1192995

ABSTRACT In order to examine a gem stone, a parameter such as girdle diameter, table diameter or crown height of the stone is determined by rotating the stone, providing an image of the stone, as seen radially, sensing the edge of the image at different angular positions o the stone, and using information derived from the edge to determine the parameter.

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