Examining the orientation of the lattice of a crystal

Details Examining the orientation of the lattice of a crystal Examining the orientation of the lattice of a crystal

G - Physics

01

N

G01N 23/207 (2006.01)

Patent

CA 2339109

To examine a diamond (3), the diamond (3) is irradiated with a broad, substantially monochromatic, slightly non-parallel X-ray beam (2), the diamond (3) is rotated on a spindle about an axis normal to the axis of the irradiating beam (2), and an annular detector (7) coaxial with the irradiating beam (2) is used to detect the number and/or spindle angular position of diffracted rays (9) emanating from the diamond (3) around a 180~ arc coaxial with the irradiating beam (2). From the number of diffracted rays (9), one detects whether there is lattice misorientation and/or from the positions of the diffracted rays (9), one determines the orientation of the crystal lattice relative to the axis of rotation.

En vue d'examiner un diamant (3), on applique sur celui-ci le rayonnement d'un large faisceau de rayons X, sensiblement monochromatique et légèrement non parallèle (2), ce diamant (3) étant mis en rotation sur une broche autour d'un axe normal par rapport au faisceau de rayonnement (2). Un détecteur annulaire (7) coaxial avec le faisceau de rayonnement (2) est utilisé pour détecter le nombre et/ou la position angulaire de la broche des rayons diffractés (9) émanants du diamant (3) autour d'un arc de 180· coaxial avec le faisceau de rayonnement (2). Sur la base du nombre des rayons diffractés (9), on détecte l'existence d'une erreur d'orientation, et/ou sur la base des positions des rayons diffractés (9), on détermine l'orientation du faisceau cristallin par rapport à l'axe de rotation.

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