G - Physics – 01 – N
Patent
G - Physics
01
N
73/57
G01N 21/01 (2006.01) G01M 15/10 (2006.01) G01N 21/35 (2006.01)
Patent
CA 1045405
ABSTRACT OF THE DISCLOSURE The disclosure relates to a gas analysis system for measuring the amount of a selected contaminant in a sample gas. The system includes an infrared radiation generating beam, a sample cell which contains a gas, and a conduit for passing the sample gas through the sample cell. Also included in the system is a reference cell containing a reference gas, and the beam of infrared radiation is alternated through the sample cell and the reference cell. A detector, responsive to the beam, produces respectively first and second electrical signals respectively indicative of the absorption of the beam by the selected contaminant within the cells. A computer, responsive to the first and second signals, computes an output signal indicative of the amount of the selected gas contaminant in the sample gas. The temperature of the sample gas is measured to produce a gas temperature signal indicative of the temperature, and the pressure of ambient pressure is measured to produce a signal indicative of this ambient pressure. Finally, the system includes compensation means responsive to the gas temperature signal and the pressure signal for correcting the output signal. This application is related to Application Serial No. 241,288 with the same applicant as the applicant herein.
241301
Cross Thomas A.
Jowett Terence W.
Knights Anthony D. M.
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