G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 33/497 (2006.01) G01N 30/46 (2006.01) G01N 30/88 (2006.01) G01N 33/00 (2006.01) G01N 30/30 (2006.01) G01N 30/62 (2006.01)
Patent
CA 2098215
ABSTRACT OF THE DISCLOSURE An expired gas analytical device using as sample an expired gas of a patient for measuring rapidly and accurate- ly a plurality of trace amounts of gas components contained in the expired gas. The expired gas analytical device does, for separating accurately and in a short time a plurality of gas components in expired gas samples, include a plurality of columns having different gas-separation conditions such as column structures and temperatures, inject and develop expired gas samples in the columns, and process output signals from a detector to compute concentrations of the gas components by use of previously memorized calibration curves for the gas components, thereby providing clinical examination data. 27
Hiromoto Mitsuo
Ueda Hideo
G. Ronald Bell & Associates
Hiromoto Mitsuo
Ueda Hideo
LandOfFree
Expired gas analytical method and device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Expired gas analytical method and device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Expired gas analytical method and device will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1418994