Expired gas analytical method and device

G - Physics – 01 – N

Patent

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Details

G01N 33/497 (2006.01) G01N 30/46 (2006.01) G01N 30/88 (2006.01) G01N 33/00 (2006.01) G01N 30/30 (2006.01) G01N 30/62 (2006.01)

Patent

CA 2098215

ABSTRACT OF THE DISCLOSURE An expired gas analytical device using as sample an expired gas of a patient for measuring rapidly and accurate- ly a plurality of trace amounts of gas components contained in the expired gas. The expired gas analytical device does, for separating accurately and in a short time a plurality of gas components in expired gas samples, include a plurality of columns having different gas-separation conditions such as column structures and temperatures, inject and develop expired gas samples in the columns, and process output signals from a detector to compute concentrations of the gas components by use of previously memorized calibration curves for the gas components, thereby providing clinical examination data. 27

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