Extended range interferometric methods and systems

Details Extended range interferometric methods and systems Extended range interferometric methods and systems

G - Physics

01

S

G01S 5/00 (2006.01) G01B 9/02 (2006.01)

Patent

CA 2732119

An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer includes at least one phase measurement module for measuring phase differences between the source signals received at different signal receiving sensors. At least one coarse estimate of a sought parameter used to represent the at least one interferometric parameter is generated by processing the one or more signals received from the source. At least one fine estimate of the sought parameter is also generated by processing the at least one coarse sought parameter using the plurality of phase measurements received from the at least one phase measurement module. The at least one fine sought parameter represents the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter and over an extended range of values in which the sought parameter is not unambiguously determinable using only the plurality of phase measurements.

Affiliated with

Also associated with

Rating

Extended range interferometric methods and systems does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Extended range interferometric methods and systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extended range interferometric methods and systems will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1536661