Fault tolerant memory

G - Physics – 11 – C

Patent

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Details

354/223.1

G11C 7/00 (2006.01) G06F 11/10 (2006.01)

Patent

CA 2019351

ABSTRACT OF THE INVENTION A method for organizing data in a memory so that fault tolerance of the memory is optimized. Reed-Solomon symbols are stored vertically in RAM devices and a block of data consisting of such symbols is distributed throughout an array of thirty-two RAM devices organized in two columns of sixteen.

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