G - Physics – 06 – K
Patent
G - Physics
06
K
G06K 9/46 (2006.01) G06K 9/62 (2006.01) G06K 9/68 (2006.01) G06F 15/401 (1990.01)
Patent
CA 2094212
FEATURE CLASSIFICATION USING SUPERVISED STATISTICAL PATTERN RECOGNITION Abstract of the Disclosure Feature classification using a novel supervised statistical pattern recognition approach is described. A tree-like hierarchical decomposition of n-dimensional feature space is created off-line from an image processing system. The hierarchical tree is created through a minimax-type decompositional segregation of n-dimensional feature vectors of different feature classifications within the corresponding feature space. Each cell preferably contains feature vectors of only one feature classification, or is empty, or is of a predefined minimum cell size. Once created, the hierarchical tree is made available to the image processing system for real-time defect classification of features in a static or moving pattern. Each feature is indexed to the classification tree by locating its corresponding feature vector in the appropriate feature space cell as determined by a depth-first search of the hierarchical tree. The smallest leaf node which includes that feature vector provides the statistical information on the vector's classification.
Eastman Kodak Company
Gowling Lafleur Henderson Llp
LandOfFree
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