G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 9/02 (2006.01) G01B 11/25 (2006.01)
Patent
CA 2048358
FIELD SHIFT MOIRE SYSTEM ABSTRACT An apparatus and method for providing high resolution non- contact absolute contour measurements of an object with moire interferometry. The invention utilizes a projection moire system in which the entire projection system is translated to perform a field shift. The field shift produces a phase shift that is proportional to the height of the object. A coarse three dimensional map of the surface is first obtained from the phase shift. This is combined with high resolution relative measurements of the phase to obtain an absolute Z map of the surface. The invention does not suffer from the 2.pi. ambiguity problem and is suitable for prismatic discontinous structures. In addition, the present invention is applicable to industrial environments and requires a relatively inexpensive optical system. Further, the field shifting technique is applicable to fast parallel process computers thereby allowing for fast absolute contour generation of prismatic parts.
Boehnlein Albert J.
Industrial Technology Institute
Macrae & Co.
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