Flat field scanning system

Details Flat field scanning system Flat field scanning system

H - Electricity

04

N

352/53.76, 88/96

H04N 1/113 (2006.01)

Patent

CA 1061616

ABSTRACT OF THE DISCLOSURE A scanning system is provided which uses directed light from a scanning element, which directed light is reflected from a curved reflective surface for scanning across a medium with a planar object surface. The scanning element includes a planar reflective facet, such as the planar mirrored surface of a galvanometer, which scans the light across the curved reflective surface in a direction normal to its axis of curvature. To provide a linear focal line, the planar surface is tilted from its optical axis by a first angle and is off-set for rotation thogonal to the optical axis of the curved surface.

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