Focused ion beam column

H - Electricity – 01 – J

Patent

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358/25

H01J 37/317 (2006.01) H01J 37/30 (2006.01)

Patent

CA 1214577

ABSTRACT OF THE DISCLOSURE Two lens focused ion beam column (10) has an accelerating lens (20) which carries a potential to focus a nonmagnified image of the liquid metal ion source (14) on the mass analyzer slit (26). Munro lens (36) accelerates the beam of selected ion species and demagnifies the image to provide an ion writing spot of less than about 1000 .ANG. size.

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