G - Physics – 06 – F
Patent
G - Physics
06
F
G06F 11/28 (2006.01) H04J 3/14 (2006.01) H04L 1/24 (2006.01) H04L 12/26 (2006.01)
Patent
CA 2169819
To test the processing of a data frame processing unit (FPU) which, in a normal working mode, processes input data frames applied to a data frame input (FI) thereof, the data frame processing unit (FPU) is brought in a test mode. Therefore, an active test signal is applied to a test mode control input (TCI) of this data frame processing unit (FPU). When brought in the test mode, the frame counters of the data frame processing unit (FPU) have lower limits and test data frames with smaller dimensions than the input data frames are applied to the data frame input (FI).
David Johan
Moerman Erik
Van de Pol Daniel Frans Jozefina
Van Tetering Johannes Anthonius Maria
Alcatel N.v.
Robic
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