G - Physics – 01 – R
Patent
G - Physics
01
R
324/37
G01R 23/00 (2006.01) G01R 23/15 (2006.01)
Patent
CA 1181809
FREQUENCY DEVIATION TESTING AND ADJUSTING SYSTEM by Alistair W. Taylor Josef L. Fikart David Thompson Abstract of Disclosure Deviation of a frequency modulated oscillator is set by applying a square wave test signal to the input of the oscillator so as to generate a predetermined amount of symmetrical periodic frequency shift above and below the carrier when the deviation is correctly set. The output of the frequency modulated oscillator is divided down so as to be within the range of a programmable divider which is an element in the automatic phase control circuit of the oscillator. The carrier frequency of the oscillator is set by program switches which are connected to an interface logic unit that provides the control information to set the divisor of the programmable divider. The divisor is set to obtain, at an output of the divider, a binary signal having a predetermined pulse repetition rate. During testing, the square wave test signal is also applied to a control input of the interface logic unit, and the test signal is used to adjust the divisor so as to provide at the output said binary signal having the predetermined pulse repetition rate when the modulated signal is applied to the input to the programmable divider and the deviation is correctly set. A reference oscillator provides a separate binary signal which has a pulse repetition rate equal to that of said predetermined pulse repetition rate. These two binary signals are compared in a deviation test circuit and the modulation sensitivity of the frequency modulated oscillator is adjusted until the difference between the two binary signals is at a minimum.
394938
Fikart Josef L.
Taylor Alistair W.
Thompson David
Ael Microtel Ltd.
R. William Wray & Associates
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