Generalized procedure for the calibration of switched...

H - Electricity – 03 – F

Patent

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H03F 3/72 (2006.01) H01L 21/66 (2006.01) H01L 21/77 (2006.01) H01L 27/04 (2006.01) H03F 3/00 (2006.01)

Patent

CA 2266540

Within the field of integrated circuits used in amplifiers, a structure and improved method for calibrating a switched capacitor gain stage wherein the time required to self-calibrate a switched capacitor gain stage and the associated structure are reduced. The invention utilizes only a single calibration step which is performed while the output of the amplifier being calibrated is monitored. Instead of utilizing a plurality of capacitors C a1 - C an each in parallel with groups of trim capacitors C T, a single capacitor C a is used and connected to switches S1a1 and S1b1. Further, instead of a group of trim capacitors C T being connected in parallel with the capacitor to be trimmed, each of plurality of trim capacitors C T1 - C TM is connected between the input to the operational amplifier and a respective corresponding switch S1a2 - S1aN to the input reference voltage node V b0. As well, switches S1b2 - S1bn connect the respective junctions between the trim capacitors C T1 - C TM to ground.

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