G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/02 (2006.01)
Patent
CA 2648305
A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.
La présente invention concerne un système de mesure géométrique conçu pour mesurer précisément une ou plusieurs surfaces d'objets tels que des cornées, des moules, des lentilles de contact dans des moules, des lentilles de contact ou d'autres objets d'un dispositif. Le système de mesure géométrique peut employer une ou plusieurs des trois méthodes de mesure suivantes : détection de front d'onde Shack-Hartmann à maillage de front d'onde, détection de diversité de phase et interférométrie en lumière blanche.
Neal Daniel R.
Powers William Shea
Raymond Thomas Daniel
Amo Wavefront Sciences Llc
Borden Ladner Gervais Llp
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