G - Physics – 01 – N
Patent
G - Physics
01
N
73/181, 354/29
G01N 21/64 (2006.01) G01N 33/10 (2006.01) H04N 7/18 (2006.01)
Patent
CA 1258127
GRAIN DAMAGE ANALYZER Abstract of the Disclosure A grain damage analyzer illuminates a grain sample with longwave, ultraviolet radiation, causing the exposed starch of the damaged portions to fluoresce and a video camera views the illuminated grain. The video signal from the camera is digitized into an array of pixels. The number or percentage of pixels which have an intensity exceeding a predetermined threshold represents the extent of damage to the sample.
516491
Bandelow Vernon D.
Brizgis Lawrence J.
Keleher Daniel B.
Borden Ladner Gervais Llp
Deere & Company
LandOfFree
Grain damage analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Grain damage analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Grain damage analyzer will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1294496