Hall effect device test circuit

Details Hall effect device test circuit Hall effect device test circuit

G - Physics

01

R

324/48

G01R 31/26 (2006.01) G01R 33/06 (2006.01) G01R 33/07 (2006.01) G01R 35/00 (2006.01)

Patent

CA 1193664

HALL EFFECT DEVICE TEST CIRCUIT ABSTRACT OF THE DISCLOSURE A test circuit which detects Hall effect device operate and release time failures. This cir- cuit includes a magnetic field circuit, a comparison circuit, a storage circuit and a visual indication cir- cuit. The magnetic field circuit causes a Hall effect device under test to periodically switch states. The operate and release times of such switching is com- pared to predetermined thresholds by the comparison cir- cuit. Switching times within the allowable thresholds cause the storage circuit to operate the visual indica- tion circuit.

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