Hall effect device test circuit

Details Hall effect device test circuit Hall effect device test circuit

G - Physics

01

R

324/70

G01R 31/00 (2006.01) G01R 33/07 (2006.01) G01R 35/00 (2006.01)

Patent

CA 1204161

HALL EFFECT DEVICE TEST CIRCUIT ABSTRACT OF THE DISCLOSURE A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.

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