High accuracy structured light profiler

Details High accuracy structured light profiler High accuracy structured light profiler

G - Physics

01

B

33/60

G01B 11/24 (2006.01) G01B 11/25 (2006.01)

Patent

CA 1297285

ABSTRACT OF THE DISCLOSURE An optical gauging system for evaluating the surface shape of a workpiece along a particular cross section. The gauging system includes an illumination system which projects a line of light onto the workpiece surface. A viewing system is focused along a line which is illuminated when a workpiece surface is intersected by the line of light. The focused line of the viewing system is imaged onto a linear detector array. A translation mechanism is provided which moves the line of light and the focused line of the viewing system into the workpiece along the plane of the cross section of interest. The relationship between the translation mechanism and the output of the array is related to the profile shape of the workpiece along the cross section of interest.

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