High-frequency measurement setup and method for measuring a...

Details High-frequency measurement setup and method for measuring a... High-frequency measurement setup and method for measuring a...

H - Electricity

01

Q

H01Q 3/02 (2006.01) H01Q 3/08 (2006.01) H01Q 3/20 (2006.01) H01Q 19/13 (2006.01) H01Q 19/19 (2006.01)

Patent

CA 2721598

The invention relates to a high-frequency measurement setup (10) for measuring a high-frequency test object, in particular, and antenna (12), comprising - one or more reflectors (16, 18) for high-frequency signals, - a laser tracker (20), - retrotargets (22) for laser beams of the laser tracker that are disposed on the reflectors and are provided to orient the high-frequency test object, and - a measuring unit (24) that is designed to actuate the laser tracker in such a way that the high-- frequency test object and one or more reflectors are measured in terms of their propagation of high- frequency signals (26, 28).

Affiliated with

Also associated with

Rating

High-frequency measurement setup and method for measuring a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High-frequency measurement setup and method for measuring a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-frequency measurement setup and method for measuring a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1470010