High performance substrate scanning

G - Physics – 01 – N

Patent

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Details

G01N 21/84 (2006.01) G01N 21/64 (2006.01) G02B 26/10 (2006.01)

Patent

CA 2418271

An optical scanning system for examining material associated with a substrate includes at least one scanning module for displacing two or more objective lenses, at least one optical coupling system and a translation system. The two objective lenses are mounted on one or more scan arms and are constructed to scan over regions or subregions associated with the substrate. The scanning module is configured to displace the scan arm(s) to perform the scan and thereby displace the two objective lenses. Each objective lens is arranged to deliver light to the material and collect light from the material.

L'invention concerne un système de balayage optique destiné à l'étude d'un matériau associé à un substrat, comprenant au moins un module de balayage permettant de déplacer au moins deux lentilles d'un objectif, au moins un système de couplage optique et un système de translation. Les deux lentilles de l'objectif sont montées sur un ou plusieurs bras de balayage et sont conçues pour balayer des régions et des sous-régions associées au substrat. Le module de balayage est conçu pour déplacer le ou les bras de balayage pour balayer la surface du substrat et pour déplacer les deux lentilles de l'objectif. Chaque lentille de l'objectif est conçue pour envoyer de la lumière sur le matériau et pour collecter la lumière réfléchie par le matériau.

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