High resolution geologic sample scanning apparatus and...

Details High resolution geologic sample scanning apparatus and... High resolution geologic sample scanning apparatus and...

G - Physics

01

N

73/55

G01N 21/25 (2006.01)

Patent

CA 1265356

ABSTRACT OF THE DISCLOSURE An apparatus and process of analyzing samples using reflected and/or emitted radiation is described. The apparatus includes a means for containing the sample and moving the sample and/or a reflector at a uniform rate through a fixed plane. A radiation source irradiates the core sample. The reflected or emitted radiation is directed onto a detector means capable of forming electri- cal signals which are digitally encoded and recorded on a digital recorder for further interactive analysis and/or processing.

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