High resolution microscoping system using convolution...

G - Physics – 02 – B

Patent

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358/10, 354/153,

G02B 21/00 (2006.01) H01J 37/26 (2006.01)

Patent

CA 2020912

Abstract of the Disclosure An optical system including a wave source radiates a converging wave to an object. A first memory stores a function g(x,y) representing the intensity distribution of the converging wave at a substantially beam waist section thereof. A scanning system directs the con- verging wave on the object at a substantially beam waist position, and operates so as to scan the converging wave on the object. A detector detects the intensity of a secondary wave generated by interaction between the con- verging wave and the object in accordance with a scan- ning operation of the scanning means. A second memory stores a positional function I(x,y) representing the intensity distribution of the secondary wave detected by the detector. In order to obtain a sensitivity distri- bution representing the intensity of the interaction between the object and the converging wave, an arithme- tic unit obtains a function f(x,y) such that the func- tion I(x,y) stored in the second memory satisfies convolution integration of the function g(x,y) stored in the first memory and the function f(x,y).

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