High resolution observation apparatus with photon scanning...

Details High resolution observation apparatus with photon scanning... High resolution observation apparatus with photon scanning...

G - Physics

01

Q

G01Q 60/18 (2010.01) G01Q 60/20 (2010.01) G01B 5/20 (2006.01) G12B 21/06 (2006.01)

Patent

CA 2079752

ABSTRACT A high resolution apparatus for the observation of the properties of a sample material has a photon scanning microscope. The apparatus detects evanescent light emitted from the sample, the intensity of which depends on the surface structure of the sample and the specific distribution of the optical properties thereof. The apparatus provides for the detailed detection of the transparency or refractive index of a sample material in a higher resolution than the wavelength of the incident light, which is irradiated onto the sample material that is applied onto the top surface of an optical prism. The apparatus includes means for maintaining an optical fiber tip, or other means for detecting a positioning signal, at a preselected distance from the sample. Furthermore, the apparatus provides for the detection of fluorescence of the sample.

Affiliated with

Also associated with

Rating

High resolution observation apparatus with photon scanning... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High resolution observation apparatus with photon scanning..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution observation apparatus with photon scanning... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1821709