High resolution time interval measurement apparatus and method

Details High resolution time interval measurement apparatus and method High resolution time interval measurement apparatus and method

G - Physics

04

F

G04F 10/00 (2006.01)

Patent

CA 2550464

A time interval measurement apparatus and method counts the total number of full clock time periods between two measurement signals. Clock fractional time periods are generated between each of the two measurement signals and the next leading edge of a full clock time period. The total number of full clock time periods and the clock fractional time periods are converted to a time equivalent measurement and combined to generate the total time interval between the two measurement signals.

Affiliated with

Also associated with

Rating

High resolution time interval measurement apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High resolution time interval measurement apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High resolution time interval measurement apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1375793