High speed memory test system with intermediate storage...

Details High speed memory test system with intermediate storage... High speed memory test system with intermediate storage...

G - Physics

11

C

G11C 29/00 (2006.01) G01R 31/3193 (2006.01) G11C 29/56 (2006.01)

Patent

CA 2347549

Automatic test equipment for memory device testing providing continuous high- speed testing by intelligent pausing a timing means when a buffer memory is full or nearly full, the timing means being paused is capable of maintaining properly refresh and clock functions for semiconductor devices.

Dispositif auto-test pour test de mémoire assurant un test continu à grande vitesse par une gestion intelligente des pauses d'un organe de synchronisation lorsqu'une mémoire-tampon est pleine ou presque pleine, l'organe de synchronisation soumis à pause étant capable d'entretenir à bon escient les fonctions de rafraîchissement et de synchronisation au profit de dispositifs à semi-conducteurs.

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