G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 33/50 (2006.01) G01N 33/543 (2006.01)
Patent
CA 2704316
The invention is directed to a high throughput screening method for analysing and interaction between a surface of a material and an environment. The screening method of the invention comprises: providing a micro-array comprising said material and having a multitude of units at least part of which have different topography; contacting at least part of said multitude of units with said environment; and screening said micro-array for an interaction between one or more of said units and said environment.
L'invention porte sur un procédé de criblage haut débit pour analyser une interaction entre une surface d'un matériau et un environnement. Le procédé de criblage de l'invention consiste : à se procurer un microréseau comportant ledit matériau et présentant une multitude d'unités dont au moins une partie présente une topographie différente ; à mettre en contact au moins une partie de ladite multitude d'unités avec ledit environnement et à cribler ledit microréseau pour une interaction entre une ou plusieurs desdites unités et ledit environnement.
Boer Jan de
Papenburg Berendien Jacoba
Stamatialis Dimitrios
Unadkat Hemant Vijaykumar
Van Blitterswijk Clemens Antoni
Bereskin & Parr Llp/s.e.n.c.r.l.,s.r.l.
Universiteit Twente
LandOfFree
High throughput screening method and apparatus for analysing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High throughput screening method and apparatus for analysing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High throughput screening method and apparatus for analysing... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1459881