Imaging devices, elements and systems

H - Electricity – 01 – L

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345/1, 345/14

H01L 27/14 (2006.01) H01L 27/144 (2006.01) H01L 27/146 (2006.01) H01L 31/0352 (2006.01) H01L 31/09 (2006.01)

Patent

CA 1251548

ABSTRACT: Thermal-radiation imaging devices, elements and systems are described. The device comprises on a substrate (2) e.g. of sapphire semiconductor bodies or body portions in the form of parallel elongate strips (1), e.g. of cadmium mercury telluride. Biasing-electrode (6 and 7) e.g. of gold are spaced on the strips (1) for causing a bias current predominantly of majority charge carriers to flow along each strip (1). The bias current supports an ambipolar drift of radiation-generated free minority carriers in the opposite direction. At a read- out area (8) in the drift path each strip (1) branches into two parts separated by a slot (13) parallel to the strip (1). One part (11 in Figure 2) provides the contin- uation of the drift path, and narrowing of the continua- tion of the ambipolar drift path in this part (11) improves the device characteristics by increasing the electric field in this area. A read-out connection com- prises the other part (12 in Figure 2) and is separated by the slot (13) from the adjacent biasing-electrode means (6 or 7). Metal layers (6, 7, 8) providing the biasing- electrode and read-out connections may extend onto the substrate (2) over a more rounded edge at the ends of each strip (1).

351793

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