G - Physics – 03 – F
Patent
G - Physics
03
F
G03F 7/20 (2006.01) H01L 21/77 (2006.01)
Patent
CA 2216296
An imaging method for imaging a fine pattern having linear features extending along orthogonal first and second directions, is disclosed which method is characterized by: providing a light source having decreased intensity portions at a center thereof and on first and second axes defined to intersect with each other at the center and defined along the first and second directions, respectively; and illuminating the pattern with light from the light source.
Méthode de formation d images permettant de créer un motif détaillé ayant des caractéristiques linéaires qui se prolongent dans deux directions orthogonales. La méthode se caractérise par : une source lumineuse ayant des sections d intensité lumineuse décroissantes en son centre ainsi que le long d un premier et d un deuxième axes, lesquels sont conçus pour s intersecter au centre et se prolonger dans les deux directions respectivement; et par l'éclairage du motif à l aide de la source lumineuse.
Noguchi Miyoko
Suzuki Akiyoshi
Canon Kabushiki Kaisha
Ridout & Maybee Llp
LandOfFree
Imaging method for manufacture of microdevices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Imaging method for manufacture of microdevices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Imaging method for manufacture of microdevices will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1358261