Imaging system

Details Imaging system Imaging system

H - Electricity

04

N

H04N 7/18 (2006.01) G02B 21/00 (2006.01)

Patent

CA 2144532

An improved imaging system operates at the diffraction limit of the optics to which it is connected and outputs a signal representative of the sample (S) lying in the sample plane (17). The imaging system comprises a cathode ray tube (30), an optical lens system and a means for sensing (40). The cathode ray tube (30) comprises an electron gun (34) for generating an electron beam (35) in a raster pattern. The raster pattern comprises a predetermined number of horizontal lines that sie spaced vertically from each other a predetermined and equal distance. The electron beam is adapted to produce an illuminated spot (39) drat scans correspondingly in the raster pattern and wherein the spot (39) is positioned inan object plane (26). The optical lens system focuses in a diffraction limited manner, the object plane (26) on to the sample plane (17), such that the image of the spot (39) is the smallest diffraction limited size as determined by the optical lens system. The imaging system also includes zoom and contrast enhancement/suppression capabilities.

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