G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 27/02 (2006.01)
Patent
CA 2588448
The present technology provides an Impedance Measurement System (ZMS) for measuring the complex impedance of each well of a single well or multiwell microtiter plate utilizing a novel combination of parallel impedance measurement channels, multiplexing, and reference impedance networks, allowing internal correction of impedance measurement drift, maximized measurement accuracy, and minimized system size.
La présente invention concerne un système de mesure d'impédance (ZMS) destiné à la mesure de l'impédance complexe de chaque alvéole d'une microplaque de titrage comportant un ou plusieurs puits, sur la base d'une nouvelle combinaison de canaux de mesure d'impédance parallèles, de techniques de multiplexage et de réseaux à impédance de référence. Ce système permet de corriger de façon interne les dérives de mesure d'impédance, d'augmenter au maximum la précision des mesures et de réduire à un minimum les dimensions du système.
Jones David
Kupershoek Dirk
Leigh-Jones Peter
Cassan Maclean
Mds Analytical Technologies A. Business Unit Of Mds Inc.
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