Improved method of chemical ionization mass spectrometry

Details Improved method of chemical ionization mass spectrometry Improved method of chemical ionization mass spectrometry

H - Electricity

01

J

H01J 49/00 (2006.01) G01N 27/62 (2006.01) H01J 49/04 (2006.01)

Patent

CA 2492023

A method of detecting a substance present in a gas or a gas mixture using SIFT- MS technology comprising the steps of inducing a supply of alkoxmethyl cations into the inlet of the flow tube, reacting a sample of the as with the alkoxymethyl cations, analysing the reacted gas sample, and calculating the concentration of trace levels of molecules containing heteroratoms in the reacted gas sample.

Cette invention concerne un procédé utilisant la technologie SIFT-MS pour détecter la présence d'une substance dans un gaz ou un mélange de gaz. On commence par induire une arrivée de cations alcoxyméthyle dans l'entrée du tube d'écoulement, puis on fait réagir l'échantillon de gaz avec les cations alcoxyméthyle. On analyse ensuite l'échantillon de gaz après réaction, et on calcule enfin la concentration des molécules à l'état de traces contenant des hétéroatomes dans l'échantillon de gaz après réaction.

Affiliated with

Also associated with

Rating

Improved method of chemical ionization mass spectrometry does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Improved method of chemical ionization mass spectrometry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Improved method of chemical ionization mass spectrometry will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1465467