Improved methods of using ion trap mass spectrometers

Details Improved methods of using ion trap mass spectrometers Improved methods of using ion trap mass spectrometers

H - Electricity

01

J

H01J 49/26 (2006.01) H01J 49/42 (2006.01)

Patent

CA 2137137

2137137 9422565 PCTABS00033 Improved methods of using an ion trap mass spectrometer (10) whereby AC voltages supplemental to the AC trapping voltage are used for scanning the trap, for conducting chemical ionization experiments, and for conducting MS experiments, are shown. In one embodiment a broadband supplemental AC voltage is applied to rid the trap of ions above or below a preselected cutoff mass. This is particularly useful in conducting chemical ionization (CI) experiments for eliminating high mass sample ions that are formed when the reagent gas is ionized by electron impact ionization (EI). Likewise, this technique may be used to eliminate low mass reagent ions when conducting an electron impact ionization experiment in the presence of a reagent gas.

Affiliated with

Also associated with

Rating

Improved methods of using ion trap mass spectrometers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Improved methods of using ion trap mass spectrometers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Improved methods of using ion trap mass spectrometers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1812959