Improved redundancy selection circuit for semiconductor...

Details Improved redundancy selection circuit for semiconductor... Improved redundancy selection circuit for semiconductor...

G - Physics

11

C

G11C 11/34 (2006.01) G11C 11/407 (2006.01) G11C 11/413 (2006.01) G11C 29/00 (2006.01)

Patent

CA 2246763

This invention provides a data bit redundancy method and apparatus that permits the replacement of faulty bitlines on a data bit basis as opposed to a column address basis. This invention provides a semiconductor memory device having memory cells arranged in columns and rows. Normal local data lines are connected to a global data line via a first switch. A redundant memory data line is connected to the global data line via a second switch. A control generating first and second control signals are coupled to the respective first and second switches for operating the switch in response to a status of a fuse component, whereby when the fuse is intact the normal data lines are connected to the global data line and when the rise is blown the redundant data lines are connected to the global data line, thus not requiring additional redundancy address decoding circuitry.

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