G - Physics – 06 – F
Patent
G - Physics
06
F
G06F 19/18 (2011.01)
Patent
CA 2705280
Methods for comparing a first DNA profile with a second DNA profile are provided. The likelihood ratio for one hypothesis relative to another, as to the sources of the DNA, is conditioned on quantity of DNA in the test sample providing the first DNA profile and/or another sample providing the second DNA profile.
L'invention porte sur des procédés pour comparer un premier profil d'ADN avec un second profil d'ADN. Le rapport de probabilité pour une hypothèse par rapport à l'autre, quant aux sources de l'ADN, est conditionné par la quantité d'ADN dans l'échantillon de test fournissant le premier profil d'ADN et/ou un autre échantillon fournissant le second profil d'ADN.
Forensic Science Service Limited
Sim & Mcburney
LandOfFree
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