Improvements in plasma mass spectrometry

Details Improvements in plasma mass spectrometry Improvements in plasma mass spectrometry

H - Electricity

01

J

H01J 49/36 (2006.01) B01D 59/44 (2006.01) H01J 49/10 (2006.01) H05H 1/46 (2006.01)

Patent

CA 2116821

A plasma mass spectrometer has a plasma ion source (1). The source has associated with it an electromagnetic excitation means (2), which may be one or more induction coils. The excitation means is powered by an RF generator (3). Ions are sampled from the plasma ion source through an interface (15) into a vacuum chamber (16). The stream of ions is directed by an ion optics element (4) though a mass analyser (5) to an ion detector (6). The excitation means may include means (7) for altering the axial component of the electromagnetic field sustaining the plasma. Alternatively or additionally, the spectrometer may include signal detecting means (11,17) to provide feedback enabling optimisation of parameters.

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