Improvements relating to time-interleaved samplers

H - Electricity – 03 – M

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Details

H03M 1/10 (2006.01) H03M 1/12 (2006.01)

Patent

CA 2490577

This invention relates to a method of calibrating a time-interleaved analogue-to-digital sampler (10) and to a method of performing analogue-to-digital conversion with a sampler (10) so calibrated. A method of calibrating a sampler (10) having N time-interleaved ADCs (12a-d), comprises: (a) injecting in turn N calibration signals (13) into the sampler such that each calibration signal (13) occupies one of N related frequencies; (b) measuring in the frequency domain the output at each of the N related frequencies for each one of the N calibration frequencies; (c) determining the relationship that relates the input signal to the output at each of the N related frequencies for each one of the N calibration frequencies; and (d) determining from the relationship at step (c) correction factors to be applied to calibrate an output of the sampler at each of the N related frequencies.

La présente invention concerne un procédé d'étalonnage d'un échantillonneur analogique-numérique à entrelacement temporel (10) et un procédé de conversion analogique-numérique dans lequel il est fait appel à l'échantillonneur étalonné (10) selon le procédé précité. Le procédé se rapporte à un procédé d'étalonnage d'un échantillonneur (10) comprenant N convertisseurs analogiques-numériques à entrelacement temporel (12a-d), selon lequel : (a) on injecte tour à tour N signaux d'étalonnage (13) dans l'échantillonneur de façon que chaque signal d'étalonnage (13) occupe une fréquence parmi N fréquences d'étalonnage reliées ; (b) on détermine le signal d'entrée pour chacune des N fréquences d'étalonnage (13) ; (c) on mesure dans le domaine des fréquences la sortie à chacune des N fréquences reliées pour chacune des N fréquences d'étalonnage ; et (d) on détermine la relation qui unit le signal d'entrée à la sortie de chacune des N fréquences reliées pour chacune des N fréquences d'étalonnage.

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