In-circuit digital tester

Details In-circuit digital tester In-circuit digital tester

G - Physics

01

R

324/58.1

G01R 31/28 (2006.01) G01R 31/319 (2006.01) G06F 11/00 (2006.01) G06F 11/273 (2006.01)

Patent

CA 1141436

IN-CIRCUIT DIGITAL TESTER ABSTRACT OF THE DISCLOSURE An apparatus for the automatic, in-circuit testing of the electrical properties of complex digital integrated cir- cuit assemblies is disclosed. A programmed processor is pro- vided to control a set of selectable switches, which connect selected nodes of a circuit under test to certain ones of a plurality of signal lines. One of the signal lines supplies a selected digital test signal from a set of selectable test signals to the selected node. The set of test signals includ- ing a Gray code. Another of the signal lines provides a re- sponse line connecting a selected node to a functional tester that performs one of a selectable number of intermediate func- tional tests. One of the functional tests is a signature analysis of the digital response signal in accordance with a cyclic redundancy check (CRC) coding technique. Each test performed by the apparatus is specified through processor routines which select and encode the proper test signals for the particular circuit or device under test and analyze the results of the intermediate functional tests to determine if the device has functioned properly.

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