G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 11/00 (2006.01) G01N 21/84 (2006.01) G01N 21/88 (2006.01) G01N 21/952 (2006.01) G01N 21/95 (2006.01)
Patent
CA 2084819
- 12 - In-Pattern On-Line Coating Defect Detection System Abstract A defect detection system (10) of this invention applies one or more spacially-separated, orthogonally-aligned light beams (22 and 24) to a coated fiber (32) such that the light passes through the entire width of both the fiber (32) and its applied coating (31). As the light passes through a fiber (32) and coating (31) of good quality, a particular pattern, with a predictable intensity level, is produced by the forward scattered portions of the light beams directed through the coated fiber (32). In accordance with the present invention, the intensity of the forward scattered patterns is continuously monitored by a series of photodiodes (48) each located within a lens/detector module (40, 42, 44 and 46) and positioned precisely within the expected forward scatter pattern. Various defects in the coating cause the path of the light passing through the coated fiber (32) to be altered, thereby directing some of the forward scattered light outside the detection area of the photodiodes (48). Such distortion to the forward scatter patterns causes the light intensity level measured at the photodiodes (48) to decrease. Therefore, by continuously monitoring the forward scatter patterns for a reduction of light relative to the light intensity expected, the present invention provides reliable and accurate means for detecting temporally short defects, such as air bubbles, which may be present within the coating (31) of a fiber (32).
Frazee Ralph Edourd Jr.
Lovelace Charles Ridley
Morris Paul Mobley
Smithgall David Harry
American Telephone And Telegraph Company
Kirby Eades Gale Baker
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